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Все молчат, поинтересуюсь: для каких целей тестирование проводилось на 5,5В, а не номинальных 5?

Rio444 написал:

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для каких целей тестирование проводилось на 5,5В, а не номинальных 5?

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Пара цитат из мануала по ссылке в первом посте касающихся вольтажа (хотя это ИМХО очевидно, но возможно интересны конкретные параметры тестирования):

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The industry standard "recommended operating conditions" means operating voltages from 4.5V to 5.5V, temperature from 0C to 70C, maximum capacitance load on the data-line of 100pF, and maximum data-line load of 2 TTL input loads.

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Voltage Cycling:
Testing under all allowable voltage conditions. These include 4.50V, 4.75V, 5.00V, 5.25V, and 5.50V (or the range of 3.00V to 3.60V for low voltage devices).

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Voltage Bounce:
Testing data retention during voltage variation between read and write (e.g. write at 4.5V, read at 5.5V, or write at 3.6V and read at 3.0V and vice versa)

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Relative Voltage Spikes Performance:
This test provides a relative value that indicates how well a module can sustain voltage spikes before a data loss occurs. Relative relations here are not exponential. Typical good values are 3 and above. Since this test is of the Out-of-Specification type, lower results do not imply that a module is defective, as it can still work within its published specifications! As you watch the red Module Power LED during the Relative Voltage Spikes test, you will see that it flashes vigorously. This LED is directly connected to the module's power supply. SIMCHECK II creates artificial voltage spikes (of 5V to 1.5V or to 6.0V) after loading a complete test pattern. Memory devices with higher Relative Voltage Spikes figures can withstand more spikes in an actual application. Take into account that modules with larger built-in capacitors normally exhibit higher Relative Voltage Spikes figures due to the capacitors' smoothing effect on the spikes. Some complex modules, which utilize PAL chips and/or logic chips, may exhibit significantly lower Relative Voltage Spikes figures.
Note that ALL relative tests are absolutely safe, as SIMCHECK II DOES NOT exceed any allowable voltage/current rating!

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Temperature stress test (Chip-Heat mode):
In this phase, SIMCHECK II tests memory chips at the actual higher operation temperature experienced inside a computer. Being able to test at the proper temperature is extremely important because some memory problems are not exhibited until the chip is warmed up. As the mode progresses, you will note that SIMCHECK II will display the heating current in Ampere units. The Chip-Heat mode utilizes a unique phenomenon which was revealed in our research. When a DRAM chip is subjected to a unique waveform pattern, it is heated internally without the need of external heating techniques. Furthermore, this Chip-Heat method is absolutely safe as we explicitly DO NOT use higher voltages or currents beyond the memory manufacturer's ratings.

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While SIMCHECK II helps you to sort out faster memory modules in comparison to their marked WORST-CASE Access Time, care should be taken along the following general guidelines:
1. Memory chips become slower at higher temperatures - the same chip which can run at 54nS at 25C may slow down to 68nS at 70C.
Chip-Heat mode, where the module will actually be warmed to true working temperatures.
2. Memory chips become slower at lower voltages - the same chip which can run at 90nS at 5.5V may slow down to 100nS at 4.5V.

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Квинтэссенция выше процитированного:

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SIMCHECK II measures the ACTUAL Access Time of the chip as it is subjected to the maximum recommended loading condition and under the lowest voltage within the chip specifications.

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Т.е. скорость тестируется в максимально приближенным к реальности условиям: чипы прогреты и учтена возможная просадка напряжения в системе.

Vogul написал:

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На 16мб simm 30 есть?

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https://www.avito.ru/moskva/to..._707531004

Начал закачивать фотки 72-х пиновых модулей

pnr написал:

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Выглядят примерно так.

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Ну, прям таких нет.